Applied Scanning Probe Methods VII (NanoScience and Technology) Nanometer Nanophotonics




Applied Scanning Probe Methods VII (NanoScience and Technology) Nanometer Nanophotonics

 

By Bharat Bhushan (Editor), Harald Fuchs (Editor)


Publisher:   Springer
Number Of Pages:   426
Publication Date:   2006-11-10
Sales Rank: 
ISBN / ASIN:   3540373209
EAN:   9783540373209
Binding:   Hardcover
Manufacturer:   Springer
Studio:   Springer

Product Description:

 

This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and freeduan.com biological Materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. The chapters will be written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

 

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Applied Scanning Probe Methoden VII (NanoScience and Technology) Nanometer Nanophotonik 
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    Applied Scanning Probe Methods VII (NanoScience and Technology) Nanometer Nanophotonics

    Applied Scanning Probe Methods VII (NanoScience and Technology) Nanometer Nanophotonics

     

    By Bharat Bhushan (Editor), Harald Fuchs (Editor)


    Publisher:   Springer
    Number Of Pages:   426
    Publication Date:   2006-11-10
    Sales Rank: 
    ISBN / ASIN:   3540373209
    EAN:   9783540373209
    Binding:   Hardcover
    Manufacturer:   Springer
    Studio:   Springer

    Product Description:

     

    This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and freeduan.com biological Materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. The chapters will be written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

     

    http://rapidshare.com/files/34263594/Applied_Scanning_Probe_Methods_VII__Springer_2006.rar

    Applied Scanning Probe Methoden VII (NanoScience and Technology) Nanometer Nanophotonik 
    12NextPage
    << Nanotechnology and Nanoelectronics Materials Devices Measurement Techniques Nanometer NanophotonicsChemistry of Carbon Nanotubes Nanometer Nanophotonics >>